- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/26 - Electron or ion microscopes; Electron- or ion-diffraction tubes
Patent holdings for IPC class H01J 37/26
Total number of patents in this class: 1727
10-year publication summary
|
171
|
136
|
130
|
122
|
146
|
120
|
134
|
137
|
122
|
35
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 4424 |
245 |
| FEI Company | 851 |
197 |
| ASML Netherlands B.V. | 6816 |
93 |
| JEOL Ltd. | 556 |
77 |
| Carl Zeiss Microscopy GmbH | 1146 |
55 |
| KLA-Tencor Corporation | 2574 |
42 |
| Hitachi High-Technologies Corporation | 2034 |
33 |
| Protochips, Inc. | 71 |
31 |
| Hitachi High-Tech Science Corporation | 326 |
28 |
| Applied Materials Israel, Ltd. | 549 |
27 |
| Hitachi, Ltd. | 16452 |
22 |
| The Regents of the University of California | 18943 |
20 |
| ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 149 |
20 |
| Carl Zeiss MultiSEM GmbH | 85 |
20 |
| Hermes Microvision Incorporated B.V. | 129 |
17 |
| Carl Zeiss SMT GmbH | 2646 |
16 |
| NuFlare Technology, Inc. | 770 |
16 |
| Korea Research Institute of Standards and Science | 639 |
14 |
| Applied Materials, Inc. | 16587 |
13 |
| California Institute of Technology | 3884 |
12 |
| Other owners | 729 |